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S4 Fidelity — Pulsed components of RF EMF, VGIC timing errors, and mitochondrial stress

This RF Safe article argues that real-world, pulsed/modulated RF exposures may introduce “timing noise” that disrupts voltage-gated ion channel (VGIC) gating via the S4 helix, framing this as a non-thermal mechanism (“S4 Timing Fidelity”). It claims such timing drift could alter calcium and proton flux, affect…